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Silicon wafer crack detection system
Product features
Combine traditional algorithms with AI algorithms，NG standard can be adjusted，to prevent the defective wafer flowing into the next process，reduce cost and improve yield
Technical Parameters | |
|---|---|
| Technical Parameters | Related parameters |
| Model | MC-WL500 |
| working cycle time | 500ms |
| Display screen | 19-inch high-resolution television * 1 |
| Dimension（L*W*H） | 450*200*600mm |
| Operation Power | AC 220V，50HZ |
| Rated Power | 600W |
| Operation Air Pressure | 0.4~0.6Mpa |
| Environment temperature | 20~30℃ |
| Omission detection rate | ≤0.05% |
| False detection rate | ≤0.05% |
| The specific parameters are subject to change without notice. | |
